JEM-F200

Multi-purpose next-generation TEM. Quad-lens condenser, advanced scan system, pico stage drive, smart design.

• Status: Active
• Country: Japan
• Electron gun type : Cold FEG
• Electron gun type : Schottky FEG
• Optional detectors : Energy Dispersive X-ray Spectrometer (EDS), Electron Energy Loss Spectrometer (EELS), Digital Camera
• STEM : Yes
• STEM parameters: Advanced Scan System with DeScan, High-resolution STEM HAADF
• Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others) : EDS, EELS, 3D tomography
• Electron optics : Quad-lens condenser system, Advanced scan system, DeScan
• Resolution : Point to point: 0.19 nm; TEM lattice image: 0.10 nm; STEM-HAADF image: 0.14 nm
• Electron beam resolution : STEM-HAADF image: 0.14 nm; TEM lattice image: 0.10 nm
• Accelerating voltage : 20 to 200 kV
• Image parameters : HAADF STEM, STEM-EELS spectra, 3D EDS tomography
• Magnification : TEM: ×20 to ×2.0 M; STEM: ×200 to ×150 M
• Camera details : Digital camera (optional)
• Stage parameters : Pico stage drive, piezo mechanism, max tilt ±80° (with High Tilting Holder)
• Holder Types : SPECPORTERTM automated holder insertion/retraction
• Cooling system : Flow rate 10 L/min, temperature 15–20 °C (fluctuations 0.1 °C/h or less)
• Power Requirements and Consumption : Single phase 200 V, 10 kVA
• Environmental requirements : Room temp 5–25 °C (drift ≤1 °C/h), humidity ≤60%
• Dimensions and Weight: Microscope with CFEG: 2,763×1,279×1,248 mm, 2,100 kg; HV tank with CFEG: 1,719×1,000×1,300 mm, 570 kg