JEM-Z200MF

Magnetic field-free objective lens. Atomic resolution imaging with double corrector system. High-resolution STEM and TEM under magnetic field-free conditions.

• Status: Active
• Country: Japan
• Electron gun type : Cold FEG
• Optional detectors : EDS, EELS, digital camera
• STEM : Yes
• STEM parameters: Large/small convergence angle modes: 20 mrad / 1.0 mrad
• Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others) : EDS, EELS, DPC-STEM, SAED (via CV mode)
• Electron optics : Double corrector system on illumination and imaging side
• Resolution : STEM: 0.092 nm (BF/DF), TEM lattice: 0.09 nm, Info limit: 0.14 nm (MHRP); STEM: 0.136 nm (BF/DF), TEM lattice: 0.10 nm, Info limit: 0.16 nm (MWGP)
• Optical column : Field-free lens with dual corrector system
• Electron beam resolution : STEM: 0.092–0.136 nm; TEM: 0.09–0.10 nm
• Accelerating voltage : 80 kV, 200 kV
• Image parameters : Bright/Dark-field TEM, DPC-STEM, HR-STEM, Lorentz TEM
• Camera details : Digital camera (optional)
• Stage parameters : Sample tilt ±12°/±16° (MHRP) or ±25°/±27° (MWGP)
• Holder Types : Standard double-tilt holder
• Aberration Correction type : Higher-order aberration corrector (double corrector system)