LVEM 5

Benchtop TEM microscope. Offers TEM, SEM, STEM, and ED modes in one unit. Installs without special facility requirements

• Status: Active
• Country: Czechia
• Electron gun type : Schottky FEG
• Standard detectors : TEM: CCD/sCMOS; SEM: BSE; STEM: STEM detector; ED: electron diffraction
• Optional detectors : STEM detector, sCMOS camera
• STEM : Yes
• STEM parameters: STEM imaging up to 250,000×; 2.0 nm resolution; max FOV 25×25 μm
• Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others) : Electron diffraction (ED)
• Electron optics : Electrostatic single/double projection lens; permanent magnet lenses
• Resolution : TEM Boost: 1.2 nm; SEM: 4.0 nm; STEM: 2.0 nm
• Optical column : Electrostatic projection lens system with optional double lens for boost
• Electron beam resolution : 1.2–4.0 nm depending on mode
• Accelerating voltage : 5 kV
• Image parameters : TEM, SEM, STEM up to 250,000×; digitalization up to 16-bit; max 2048×2048 pixels
• Magnification : TEM Boost: 1,400 – 700,000×; STEM: max 250,000×; SEM: max 100,000×
• Chamber : Ultra-high vacuum column with airlock
• Camera details : TEM: CCD or sCMOS; 12–16-bit digitalization; SEM/STEM: 2048×2048 px
• Stage parameters : X, Y: ±1 mm; Z: ±0.3 mm; tilt: ±22°
• Holder Types : Standard Ø 3.05 mm TEM grids
• Sample size: 3.05 mm TEM grids
• Cooling system : Not required (permanent magnet lenses)
• Vacuum system : Diaphragm + turbo pumps (10⁻⁵ mbar); ion getter (10⁻⁷ mbar); gun (10⁻⁹ mbar)
• Power Requirements and Consumption : 100–240 V / 50–60 Hz; max 810 VA
• Environmental requirements : No special requirements (no cooling, special power, or vibration isolation)
• Vibration, Magnetic, Noise tolerance : Not required; designed to work without isolation
• Dimensions and Weight: Microscope: 296×440×690 mm, 25 kg; Pump: 300×300×355 mm, 17 kg; Electronics: 470×270×290 mm, 19 kg