Specifications

  • Category: Inorganic and Isotopic Mass Spectrometry
  • Technique: Secondary Ion Mass Spectrometry
  • Manufacturer: IONTOF
  • Country: Germany
  • Available: Active
All specifications

About

Short description

A hybrid mass spectrometry system combining Time-of-Flight and Orbitrap analyzers. Provides mass resolution >240,000 and mass accuracy <1 ppm Optimized for advanced molecular analysis, 3D imaging, and high-resolution organic spectrometry.

Specifications

A hybrid mass spectrometry system combining Time-of-Flight and Orbitrap analyzers. Provides mass resolution >240,000 and mass accuracy <1 ppm Optimized for advanced molecular analysis, 3D imaging, and high-resolution organic spectrometry.

  • Status: Active
  • Country: Germany
  • Isotopic: Yes
  • Elemental: Yes
  • Type of measurable elements: Most of elements, isotopes, and molecular species
  • Measurable isotopes/elements: Organic and inorganic species, isotopes across the periodic table
  • Analyzer type : Time-of-Flight MS
  • Analyzer type : Orbitrap MS
  • Ion source type: Bismuth cluster ion source, Gas Cluster Ion Source (GCIB)
  • Inlet types: Ultra-high vacuum chamber with advanced sample handling
  • High Resolution : Yes
  • Mass resolution/ Mass resolving power : >240,000 (Orbitrap)
  • Dynamic range : 7 orders of magnitude
  • Detection limits : Sub-ppm levels
  • Precision : <1 ppm mass accuracy
  • Detector type : Orbitrap analyzer and time-of-flight detectors
  • Primary beam : Bi3+, Gas Cluster Ion Source (GCIB)
  • Voltage : Up to 30 kV
  • Spatial resolution : <50 nm
  • Depth profile : High depth resolution (<1 nm)
  • Beam energy : Adjustable up to 30 keV
  • Camera : High-resolution CCD camera for sample navigation
  • Geometry type : Dual TOF-Orbitrap configuration
  • Focusing type : Electrostatic focusing
  • Cooling system : Closed-loop liquid nitrogen cooling system
  • Vacuum system : Ultra-high vacuum with dry pumps
  • Gas supply: Argon, oxygen, and inert gases

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M6

  • Category: Inorganic and Isotopic Mass Spectrometry
  • Technique: Secondary Ion Mass Spectrometry
  • Manufacturer: IONTOF
  • Country: Germany
  • Available: Active
Detailed