Specifications

  • Category: Inorganic and Isotopic Mass Spectrometry
  • Technique: Secondary Ion Mass Spectrometry
  • Manufacturer: SAI (Scientific Analysis Instruments)
  • Country: UK
  • Available: Active
All specifications

About

Short description

High-res TOF-SIMS with multiplexed imaging and ion gun flexibility.

Specifications

High-res TOF-SIMS with multiplexed imaging and ion gun flexibility.

  • Status: Active
  • Country: UK
  • Isotopic: Yes
  • Elemental: Yes
  • Type of measurable elements: Most of elements, isotopes, and molecular species
  • Analyzer type : Time-of-Flight MS
  • Ion source type: Au LMIG (opt. Ga, O, C₆₀, Bi)
  • Inlet types: Direct surface
  • Mass range : Up to 3000 m/z
  • Mass resolution/ Mass resolving power : >1200 m/Δm 27 m/z
  • Sensitivity : >10⁶ cps/nA
  • Detection limits : ppm level
  • Precision : <50 ppm (with calibration)
  • Primary beam : Au, Ga, O, C₆₀, Bi
  • Voltage : Variable, e.g. 5–25 keV
  • Spatial resolution : <100 nm
  • Depth profile : Yes
  • Beam energy : Ion-gun dependent
  • Focusing type : High-res ion optics
  • Vacuum system : <1×10⁻⁶ mbar; pump down <10 min (dry N₂)
  • Gas supply: Dry N₂
  • Power Requirements and Consumption : <2.5 kVA, single phase
  • Dimensions and Weight: 149×82×170 cm, ~300 kg

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MidiSIMS-ToF-HR

  • Category: Inorganic and Isotopic Mass Spectrometry
  • Technique: Secondary Ion Mass Spectrometry
  • Manufacturer: SAI (Scientific Analysis Instruments)
  • Country: UK
  • Available: Active
Detailed