Specifications

  • Category: Inorganic and Isotopic Mass Spectrometry
  • Technique: Secondary Ion Mass Spectrometry
  • Manufacturer: SAI (Scientific Analysis Instruments)
  • Country: UK
  • Available: Active
All specifications

About

Short description

Entry-level quadrupole SIMS for elemental and organic surface analysis.

Specifications

Entry-level quadrupole SIMS for elemental and organic surface analysis.

  • Status: Active
  • Country: UK
  • Isotopic: Yes
  • Elemental: Yes
  • Type of measurable elements: Most of elements, isotopes, and molecular species
  • Measurable isotopes/elements: All elements and light organics
  • Analyzer type : Quadrupole MS (single)
  • Ion source type: Ga⁺ beam (5 keV)
  • Inlet types: Direct solid surface
  • Mass range : 3–300 m/z
  • Mass resolution/ Mass resolving power : >95 m/z (10% valley)
  • Sensitivity : >5×10³ cps/nA (e.g. ⁹⁸Mo⁺, ⁹⁸MoO⁺)
  • Detection limits : ppm level
  • Precision : <0.4 Da mass accuracy
  • Detector type : Single channel, PC-based
  • Primary beam : Ga⁺
  • Voltage : 5 keV
  • Spatial resolution : <10 µm
  • Depth profile : Yes
  • Beam energy : 5 keV
  • Geometry type : Linear
  • Focusing type : Electrostatic
  • Vacuum system : <1×10⁻⁶ mbar; pump down <5 min (dry N₂)
  • Gas supply: Dry N₂
  • Power Requirements and Consumption : <1.2 kVA, single phase
  • Dimensions and Weight: <0.8 m², ~100 kg

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MiniSIMS-TOF

  • Category: Inorganic and Isotopic Mass Spectrometry
  • Technique: Secondary Ion Mass Spectrometry
  • Manufacturer: SAI (Scientific Analysis Instruments)
  • Country: UK
  • Available: Active
Detailed