Phenom ParticleX Steel

Desktop SEM for analyzing non-metallic inclusions in steel. Supports inclusion size, shape, and chemistry measurements using EDX and SEM. Offers recipes for Al-killed, Si-killed, and Ca-treated steels.

• Status: Active
• Country: USA
• Electron gun type : CeB₆ Thermionic source
• Standard detectors : Backscattered electron detector; Energy Dispersive Spectroscopy detector
• Optional detectors : Secondary electron detector
• Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others) : Energy dispersive spectroscopy (EDS); Elemental mapping; Line scan; ternary plots
• Resolution : <10 nm
• Electron beam resolution : <10 nm
• Beam current : Multiple beam currents
• Accelerating voltage : Default: 5 kV, 10 kV and 15 kV; Advanced: 4.8–20.5 kV
• Image parameters : JPEG, TIFF, BMP; 960×600, 1920×1200, 3840×2400, 7680×4800 px
• Magnification : 160–200,000x
• Camera details : Proprietary high-resolution color navigation camera, single shot
• Stage parameters : Computer-controlled motorized X and Y
• Holder Types : 49-stub insert (optional)
• Sample size: Max. 100 mm x 100 mm (up to 36 x 12 mm pin stubs); Max. 40 mm height (optional up to 65 mm)
• Vacuum system : Vacuum levels: Low - medium - high
• Power Requirements and Consumption : Single phase AC 100–240 V, 50/60 Hz, 300 W (max)
• Environmental requirements : Temperature 15°C ~ 30°C; Humidity 20% < RH < 80%
• Dimensions and Weight: Imaging module: 316×587×625 mm, 75 kg