Phenom ParticleX TC

Desktop SEM for automated technical cleanliness analysis following VDA 19 / ISO 16232. Measures and classifies particles on 47 mm filters using EDX and SEM imaging. Supports reanalysis, mapping, and report generation per automotive industry standards.

• Status: Active
• Country: USA
• Electron gun type : CeB₆ Thermionic source
• Standard detectors : Backscattered electron detector; Energy Dispersive Spectroscopy detector
• Optional detectors : Secondary electron detector
• Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others) : Energy dispersive spectroscopy (EDS); Elemental mapping; Line scan
• Resolution : <14 nm
• Electron beam resolution : <14 nm
• Beam current : Multiple beam currents
• Accelerating voltage : Default: 5 kV, 10 kV and 15 kV; Advanced: 4.8–20.5 kV
• Image parameters : JPEG, TIFF, BMP; 456×456, 684×684, 1024×1024, 2048×2048 px
• Magnification : 80–100,000x
• Camera details : Proprietary high resolution color navigation camera, single shot
• Stage parameters : Computer-controlled motorized X and Y
• Holder Types : 49-stub insert (optional)
• Sample size: Max. 100 mm x 100 mm (up to 36 x 12 mm pin stubs); Max. 65 mm height
• Vacuum system : Vacuum levels: Low - medium - high
• Power Requirements and Consumption : Single phase AC 110–240 V, 50/60 Hz, 300 W (max)
• Environmental requirements : Temperature 15°C ~ 30°C; Humidity <80% RH
• Dimensions and Weight: Imaging module: 316×587×625 mm, 75 kg