Phenom Pharos G2

Desktop FEG-SEM with attractive form factor and short training required

• Status: Active
• Country: USA
• Electron gun type : Schottky FEG
• Standard detectors : High-sensitivity backscattered electron detector (multi-mode)
• Optional detectors : Everhart-Thornley secondary electron detector (SED)
• Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others) : Elemental analysis (EDS); Elemental Mapping and Line Scan; Application software: 3D roughness, ParticleMetric, PoroMetric, FiberMetric
• Electron optics : Field emission SEM
• Resolution : <2.0 nm (SE), 3 nm (BSE) at 20 kV; 10 nm (SE) at 3 kV
• Electron beam resolution : <2.0 nm (SE), 3 nm (BSE) at 20 kV; 10 nm (SE) at 3 kV
• Accelerating voltage : 1–20 kV
• Image parameters : JPEG, BMP, 8-bit TIFF; image resolution options: 960x600, 1920x1200, 3840x2400, and 7680x4800 pixels
• Magnification : Maximum SEM magnification 2,000,000x
• Camera details : Navigation camera: Magnification range (monitor) 27–160x; Selectable axial and off-axis LED illumination
• Stage parameters : Computer controlled, motorized X and Y; Max stage travel: 18x18 mm
• Holder Types : Sample holders for resin mount, 1.0” core plug, micro tool and tilt-rotation, temperature control, motorized tilt and rotation and electrical feedthrough; Inserts for micro-electronics, X-view
• Sample size: 25 mm (Ø); Option for 35 mm (Ø) and 100 mm (h) available
• Vacuum system : Integrated low-/medium-/high-vacuum modes standard
• Power Requirements and Consumption : Single phase AC 100–240 Volt, 50/60 Hz, 153 W average, 378 W max
• Environmental requirements : Temperature 15°C ~ 30°C (59°F ~ 86°F); Humidity 20–80% RH; Maximum operation altitude 2,000 m
• Dimensions and Weight: Imaging module: 360x580x590 mm, 75 kg