Specifications

  • Category: Optical Emission Spectroscopy
  • Technique: Spark-OES/GD-OES
  • Manufacturer: Bruker
  • Country: USA
  • Available: Active
All specifications

About

Short description

Advanced benchtop Spark-OES analyzer with full wavelength access, dual-path optics, and long-term stability.

Specifications

Advanced benchtop Spark-OES analyzer with full wavelength access, dual-path optics, and long-term stability.

  • Status: Active
  • Country: USA
  • Type of measurable elements: Metals and non-metals
  • Measurable isotopes/elements: Full spectrum (130–785 nm); covers light and heavy elements
  • Possible Matrixes : All major metal bases including Fe, Al, Cu, Ni, Zn, Mg, Ti, etc.
  • Optic System : MultiVision dual-path optics, Paschen-Runge mount, linear array detectors; AAC for thermal drift elimination
  • Optical chamber : Fully argon-purged chamber with Argon Shield to reduce window contamination
  • Detection system/detector : Multiple uncoated linear CCD arrays with high UV-C transparency
  • Grating /Wavelength range : 130–785 nm with optimized grating, high resolution Paschen-Runge mount
  • Spark Stand : 3-side accessible, low-maintenance with co-axial argon flow, SafetyTip for varied sample sizes
  • Source frequency : Up to 1000 Hz (SmartSpark™) with real-time monitoring for non-energetic discharges
  • Correction : AAC and MultiVision with electromagnetic switching between plasma views
  • Gas supply: Argon ≥ 99.998% (4.8), 3 bar ±10%, argon-saver mode for minimal usage
  • Power Requirements and Consumption : 100–240 V, 50/60 Hz; typically 95 W analysis, 20 W standby
  • Environmental requirements : < 55 dB noise; standard ambient lab conditions
  • Dimensions and Weight: 490 x 570 x 284 mm, ~36 kg

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  • Category: Electron Microscopy
  • Technique: Transmission Electron Microscopy
  • Manufacturer: Bruker
  • Country: USA
  • Available: Active
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