Spectra Ultra

Highest resolution STEM with Ultra-X EDX; Adjustable kV per session; Low-dose, beam-sensitive imaging

• Status: Active
• Country: USA
• Electron gun type : Cold FEG
• Electron gun type : Extreme FEG
• Standard detectors : Ultra-X EDX; Panther STEM detector
• Optional detectors : EMPAD; Ceta S/M; Gatan OneView; Energy Filters
• STEM : Yes
• STEM parameters: iDPC, Panther, Ultra-X, AFIS, EELS mapping
• Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others) : STEM-EDX, EELS, iDPC, DPC, tomography
• Electron optics : X-FEG/UltiMono or X-CFEG; S-CORR corrector; S-TWIN lens
• Resolution : STEM: 50 pm at 300 kV; 125 pm at 30 kV
• Optical column : 3-lens condenser; ConstantPower Lens; low hysteresis
• Electron beam resolution : Energy spread: 0.025 eV (UltiMono); 0.4 eV (X-CFEG)
• Beam current : Probe currents: <1 pA to 100 pA, per resolution level
• Accelerating voltage : 30–300 kV (live switchable)
• Image parameters : <50 pm STEM resolution; <25 meV energy resolution
• Chamber : Wide-gap 5.4 mm S-TWIN pole piece
• Camera details : Ceta S/M; Gatan OneView IS; SmartCam suite
• Stage parameters : Piezo 5-axis; ±35°/±30° (Ultra-X); ±70° tomography
• Holder Types : Single/double tilt, tomography, in situ
• Aberration Correction type : S-CORR (probe/image), A5-corrected, CEOS Auto
• Cooling system : Cold trap (3-day operation)
• Environmental requirements : Passive/active vibration isolation (optional iVIS)
• Vibration, Magnetic, Noise tolerance : Optional active isolation; acoustic enclosure