SPECTRO ARCOS

ICP-OES analyzer with dual side-on interface (DSOI) for enhanced sensitivity. MultiView technology enables axial and radial plasma observation in one instrument. Designed for advanced Across industrial, chemical, and academic applications.

• Status: Active
• Country: Germany
• Elemental: Yes
• Type of measurable elements: Metals and non-metals
• Measurable isotopes/elements: Elemental coverage for major and trace Across 130–770 nm
• Sensitivity : Sub-ppb sensitivity for trace elements; optimized for challenging matrices
• Signal stability, relative standard deviation : <1% RSD for long-term operation; precise gas flow control for stable performance
• Spray chamber : Cyclonic spray chamber
• Nebulizer : Concentric nebulizer; optional ultrasonic nebulizer for enhanced sensitivity
• Peristaltic pump : Cassette-style pump for simplified operation and consistent pressure
• RF generator frequency : 27.12 MHz
• RF generator power : Up to 2.0 kW adjustable; warm-up time <10 minutes
• View orientation/observation/optical system : MultiView plasma observation (axial/radial), DSOI (Dual Side-On Interface), and standard radial side-on configurations
• Detection system/detector : CMOS-based detectors
• Grating /Wavelength range : 130–770 nm with ORCA (Optimized Rowland Circle Alignment) technology
• Polychromator : ORCA polychromator with direct light path for reduced light loss and superior resolution
• Typical resolution : High spectral resolution with minimal line overlap for line-rich spectra
• Gas supply: Argon ≥99.995%; low gas consumption with sealed UV-PLUS optics
• Power Requirements and Consumption : 230 V, 50/60 Hz; power consumption ~3.5 kVA
• Environmental requirements : Temperature: 15–35°C; Humidity: 20–80%
• Dimensions and Weight: 1068 mm H × 1582 mm W × 756 mm D; Footprint: 1065 mm W × 646 mm D; Weight: ~240 kg