SurfaceSeer-I 

High-sensitivity TOF-SIMS for imaging and chemical mapping of surfaces.

• Status: Active
• Country: UK
• Isotopic: Yes
• Elemental: Yes
• Type of measurable elements: Most of elements, isotopes, and molecular species
• Measurable isotopes/elements: Isotopic and elemental
• Analyzer type : Time-of-Flight MS
• Ion source type: 25 kV LMIG
• Inlet types: Direct surface
• Mass range : >1000 m/z
• Mass resolution/ Mass resolving power : >3000 m/δm
• Sensitivity : >1×10⁹ atoms/cm²
• Detection limits : ppm level
• Precision : ±5 milli amu
• Primary beam : 25 kV LMIG
• Voltage : 25 kV
• Spatial resolution : <0.5 µm
• Depth profile : Yes
• Beam energy : 25 kV
• Camera : Yes (beam tuning & imaging)
• Focusing type : High brightness beam
• Vacuum system : <1×10⁻⁶ mbar; pump down <5 min