SurfaceSeer S 

Compact and affordable TOF-SIMS for routine high-sensitivity surface analysis.

• Status: Active
• Country: UK
• Isotopic: Yes
• Elemental: Yes
• Type of measurable elements: Most of elements, isotopes, and molecular species
• Measurable isotopes/elements: Isotopic and elemental
• Analyzer type : Time-of-Flight MS
• Ion source type: 5 keV Cs+ (optionally Ar+)
• Inlet types: Direct surface
• Mass range : >1000 amu (to 10,000 amu with option)
• Mass resolution/ Mass resolving power : >2500 m/δm
• Sensitivity : >1×10⁹ atoms/cm²
• Detection limits : ppm level
• Precision : ±5 milli amu
• Primary beam : Pulsed Cs+
• Voltage : 5 keV
• Spatial resolution : 100–1000 µm analysis area
• Depth profile : Yes
• Beam energy : 5 keV
• Camera : Optional
• Focusing type : Low energy electron compensation
• Vacuum system : <1×10⁻⁶ mbar; pump down <5 min
• Gas supply: Dry N₂, Ar (optional)