Talos F200S

High-resolution S/TEM with EDS; Dynamic experiments with ±90° stage; Smart scanning engine

• Status: Active
• Country: USA
• Standard detectors : Ceta 16M CMOS, 2 SDD EDS detectors
• STEM : Yes
• STEM parameters: HAADF STEM; DPC imaging
• Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others) : EDS, DPC imaging
• Electron optics : Constant-power X-TWIN objective lens
• Resolution : TEM: 0.12 nm; STEM HAADF: 0.16 nm
• Optical column : Class-leading optics with constant-power lens
• Electron beam resolution : STEM HAADF: 0.16 nm
• Beam current : Total FEG: >150 nA; Probe: 0.6 nA at 1 nm probe
• Accelerating voltage : 200 kV
• Image parameters : Ceta 16M: up to 25 fps at 512×512
• Camera details : Ceta 16M CMOS
• Stage parameters : Z ±0.375 mm; Tilt ±90° with stage; α ±35°, β ±30° (double tilt)
• Holder Types : In situ sample holders
• Vibration, Magnetic, Noise tolerance : Enclosure & SmartCam reduce environmental effects