TENSOR

Near-UHV, analytical 4D-STEM with precession and real-time EDS mapping. Simplifies multimodal materials analysis

• Status: Active
• Country: Czechia
• Electron gun type : Schottky FEG
• Standard detectors : Direct electron detector (QUADRO), dual EDS (window-less), BF/ADF/HAADF STEM
• Optional detectors : Virtual STEM, strain, tomography, diffraction tomography (3DPED), PETS software
• STEM : Yes
• STEM parameters: Virtual STEM, analytical STEM with EDS at each pixel, tomographic modes
• Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others) : 4D-STEM, EDS, orientation, strain, diffraction tomography, Virtual STEM
• Electron optics : Inverted STEM column with precession diffraction, direct detection camera, and beam blanking
• Resolution : STEM lattice: 2.8Å (BF), 3.5Å (HAADF); 4D-STEM enabled orientation/phase/strain maps
• Optical column : 4D-STEM-specific with direct detector, PED, dual EDS, real-time beam alignment
• Electron beam resolution : Atomic resolution (STEM); 1–3.5 nm dependent on mode
• Accelerating voltage : 50 eV – 30 keV
• Image parameters : Orientation/phase mapping, lattice imaging, diffraction, 4D-STEM datasets, tomography
• Magnification : 1 gigapixel STEM images with 10 Mpix/s acquisition
• Chamber : UHV, ConFlat flanges, copper gaskets, <10⁻⁶ Pa sample area
• Camera details : Direct electron detector (QUADRO), 512×512 px, 2250 fps
• Stage parameters : Motorized, precession and XY tilt with <1 nm beam diameter
• Holder Types : STEM and diffraction, lamella and tomography prep
• Sample size: Nano to submicron crystalline particles (STEM/Diffraction)
• Aberration Correction type : Precession and integrated beam alignment reduce aberration
• Vacuum system : Near UHV <10⁻⁶ Pa sample chamber