Specifications

  • Category: Electron Microscopy
  • Technique: Desctop EM
  • Manufacturer: Hitachi High-Tech
  • Country: Japan
  • Available: Active
All specifications

About

Short description

Tabletop SEM with charge-up reduction mode. SE and BSE imaging for non-conductive samples. Supports fast EDS and large-area stitching

Specifications

Tabletop SEM with charge-up reduction mode. SE and BSE imaging for non-conductive samples. Supports fast EDS and large-area stitching

  • Status: Active
  • Country: Japan
  • Electron gun type : W Thermionic source
  • Standard detectors : 4-segment BSE detector
  • Optional detectors : STEM holder, Tilt & rotation stage, Cooling stage
  • Cryo : Optional
  • STEM : Optional
  • STEM parameters: STEM holder
  • Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others) : EDS, Multi Zigzag, Report Creator
  • Electron optics : High-sensitivity 4-segment BSE detector with SE detection in low vacuum
  • Accelerating voltage : 5, 10, 15, 20 kV
  • Image parameters : BSE, SE, Mixed (BSE+SE), Charge-up reduction
  • Magnification : 10×–100,000× (photo), 25×–250,000× (monitor)
  • Chamber : Max diameter 80 mm, height 50 mm
  • Camera details : Image sizes: 2560×1920, 1280×960, 640×480; formats: BMP, TIFF, JPEG
  • Stage parameters : X: 40 mm, Y: 35 mm; motorized stage (PlusII), manual (TM4000II)
  • Holder Types : STEM holder, tilt/rotation stage, cooling stage
  • Sample size: Diameter 80 mm, height 50 mm
  • Cooling system : Optional cooling stage
  • Vacuum system : Turbo molecular pump (67 L/s), diaphragm pump (20 L/min)
  • Power Requirements and Consumption : Single phase AC100–240 V, 500 VA
  • Environmental requirements : 15–30 ℃, ≤70% RH (no condensation)
  • Dimensions and Weight: 330×617×547 mm, 54 kg

Articles

Other company product

OE750

  • Category: Optical Emission Spectroscopy
  • Technique: Spark-OES/GD-OES
  • Manufacturer: Hitachi High-Tech
  • Country: Japan
  • Available: Active
Detailed