Specifications

  • Category: Electron Microscopy
  • Technique: Desctop EM
  • Manufacturer: Hitachi High-Tech
  • Country: Japan
  • Available: Active
All specifications

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Short description

Next-generation tabletop SEM with filament monitoring and automation. Low-vacuum imaging without preprocessing. High-current mode for EDS and fast particle analysis

Specifications

Next-generation tabletop SEM with filament monitoring and automation. Low-vacuum imaging without preprocessing. High-current mode for EDS and fast particle analysis

  • Status: Active
  • Country: Japan
  • Electron gun type : W Thermionic source
  • Standard detectors : 4-segment BSE detector, UVD SE detector
  • Optional detectors : STEM holder, Tilt & rotation stage, Cooling stage
  • Cryo : Optional
  • STEM : Optional
  • STEM parameters: STEM holder for transmission imaging
  • Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others) : EDS, AZtecLiveLite, Multi Zigzag, Recipe automation, Report Creator
  • Electron optics : High-sensitivity BSE detector with low-vacuum function
  • Beam current : High-current function enabled (Mode 5)
  • Accelerating voltage : 5, 10, 15, 20 kV
  • Image parameters : BSE, SE, Mixed (BSE+SE), Charge-up reduction
  • Magnification : 10×–100,000× (photo), 25×–250,000× (monitor)
  • Chamber : Max diameter 80 mm, height 50 mm
  • Camera details : Image sizes: 2560×1920, 1280×960, 640×480; formats: BMP, TIFF, JPEG
  • Stage parameters : X: 40 mm, Y: 35 mm; motorized stage (PlusIII), manual (TM4000III)
  • Holder Types : STEM holder, tilt/rotation stage, cooling stage
  • Sample size: Diameter 80 mm, height 50 mm
  • Cooling system : Optional cooling stage (to –25 ℃)
  • Vacuum system : Turbo molecular pump (67 L/s), diaphragm pump (20 L/min)
  • Power Requirements and Consumption : Single phase AC100–240 V (Min 90 V, Max 250 V), 500 VA
  • Environmental requirements : 15–30 ℃, ≤70% RH (no condensation)
  • Dimensions and Weight: TM4000PlusIII: 330×614×547 mm, 55 kg; TM4000III: 330×617×547 mm, 53 kg

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Other company product

SU3900SE/SU3800SE

  • Category: Electron Microscopy
  • Technique: Scanning Electron Microscopy
  • Manufacturer: Hitachi High-Tech
  • Country: Japan
  • Available: Active
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