Specifications

  • Category: Electron Microscopy
  • Technique: Desctop EM
  • Manufacturer: ZEPTOOLS
  • Country: China
  • Available: Active
All specifications

About

Short description

Lightweight version of ZEM 15 with core imaging capabilities; designed for routine imaging tasks

Specifications

Lightweight version of ZEM 15 with core imaging capabilities; designed for routine imaging tasks

  • Status: Active
  • Country: China
  • Electron gun type : W Thermionic source
  • Standard detectors : SE
  • Optional detectors : BSE, EDS, automated particle/inclusion analysis
  • Cryo : Optional
  • Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others) : EDS (B–Cf); energy resolution 129 eV; multichannel analyzer 2048 ch; elemental mapping and particle analysis
  • Resolution : 10 nm
  • Electron beam resolution : 10 nm
  • Accelerating voltage : 15 kV
  • Image parameters : JPEG/TIFF/BMP; 2048×2048 px; digital nav camera
  • Magnification : up to 150,000×
  • Chamber : Sample holder Ø 50 mm; max height 35 mm
  • Camera details : Optical navigation camera; color image
  • Stage parameters : X/Y: 25×25 mm; manual Z adjustment
  • Sample size: Ø 50 mm, max height 35 mm
  • Cooling system : Optional cooling stage
  • Vacuum system : Fore-vacuum membrane pump
  • Power Requirements and Consumption : 110–240 V, 50/60 Hz, 400 W
  • Environmental requirements : 15–30 °C; max 80% humidity
  • Dimensions and Weight: 283 × 553 × 505 mm; 75 kg

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ZEM 20

  • Category: Electron Microscopy
  • Technique: Desctop EM
  • Manufacturer: ZEPTOOLS
  • Country: China
  • Available: Active
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