Specifications

  • Category: Electron Microscopy
  • Technique: Desctop EM
  • Manufacturer: ZEPTOOLS
  • Country: China
  • Available: Active
All specifications

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Short description

Advanced desktop SEM with low vacuum mode, optional 5-axis stage, and high sample chamber volume

Specifications

Advanced desktop SEM with low vacuum mode, optional 5-axis stage, and high sample chamber volume

  • Status: Active
  • Country: China
  • Electron gun type : W Thermionic source
  • Optional detectors : SE, BSE, EDS (all optional)
  • Cryo : Optional
  • Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others) : EDS (B–Cf), 129 eV resolution, 2048 channels, particle analysis
  • Resolution : 5 nm
  • Electron beam resolution : 5 nm
  • Accelerating voltage : 20 kV
  • Image parameters : 2048×2048 px; JPEG/TIFF/BMP; digital nav camera
  • Magnification : Up to 360,000×
  • Chamber : Sample table Ø 50 mm; sample size up to 80×100 mm; height up to 75 mm
  • Camera details : Color digital navigation camera
  • Stage parameters : XY: 60×60 mm; Z: manual/motorized; 5-axis option
  • Sample size: Up to 80×100 mm
  • Cooling system : Optional: Peltier or LN₂ stage
  • Vacuum system : Membrane forevacuum pump; low vacuum mode supported
  • Power Requirements and Consumption : 110–240 V, 50/60 Hz, 400 W
  • Environmental requirements : 15–30 °C, ≤80% humidity
  • Dimensions and Weight: 370×656×633 mm; 130 kg

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ZEM 20Pro

  • Category: Electron Microscopy
  • Technique: Desctop EM
  • Manufacturer: ZEPTOOLS
  • Country: China
  • Available: Active
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