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AURA 200
Main
Inst. Database
Desctop EM
Specifications
Category:
Electron Microscopy
Technique:
Desctop EM
Manufacturer:
Seron
Country:
South Korea
Available:
Active
All specifications
Download “Conclusions.PDF”
Download “Conclusions.PDF”
About
Specifications
About
Short description
Advanced compact SEM. Designed to minimize EMI and vibration. 2-stage lens system.
All about
Specifications
Advanced compact SEM. Designed to minimize EMI and vibration. 2-stage lens system.
Status:
Active
Country:
South Korea
Electron gun type
:
W Thermionic source
Standard detectors
:
SE
Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others)
:
AOI Tool
Electron optics
:
2-Stage Lens (CL & OL)
Resolution
:
< 7nm @ 20KeV
Accelerating voltage
:
From 1kV
Image parameters
:
Area Mode(640x480), Photo(3840x2880)
Magnification
:
100,000X + Digital Zoom 2X, 4X
Stage parameters
:
X,Y(40mm) / Z(530mm) / Rotation(360°) / Tilt(045°)
Aberration Correction type
:
Aberration reduction optic design
Power Requirements and Consumption
:
220–230V AC, 5KW, 50/60Hz
Environmental requirements
:
22±2°C, Humidity < 70%
Vibration, Magnetic, Noise tolerance
:
3μm/sec @ 5–10Hz; EMI compliant
Dimensions and Weight:
360(W) × 440(D) × 580(H) mm
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