Specifications

  • Category: Electron Microscopy
  • Technique: Desctop EM
  • Manufacturer: Seron
  • Country: South Korea
  • Available: Active
All specifications

About

Short description

Advanced compact SEM. Designed to minimize EMI and vibration. 2-stage lens system.

Specifications

Advanced compact SEM. Designed to minimize EMI and vibration. 2-stage lens system.

  • Status: Active
  • Country: South Korea
  • Electron gun type : W Thermionic source
  • Standard detectors : SE
  • Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others) : AOI Tool
  • Electron optics : 2-Stage Lens (CL & OL)
  • Resolution : < 7nm @ 20KeV
  • Accelerating voltage : From 1kV
  • Image parameters : Area Mode(640x480), Photo(3840x2880)
  • Magnification : 100,000X + Digital Zoom 2X, 4X
  • Stage parameters : X,Y(40mm) / Z(530mm) / Rotation(360°) / Tilt(045°)
  • Aberration Correction type : Aberration reduction optic design
  • Power Requirements and Consumption : 220–230V AC, 5KW, 50/60Hz
  • Environmental requirements : 22±2°C, Humidity < 70%
  • Vibration, Magnetic, Noise tolerance : 3μm/sec @ 5–10Hz; EMI compliant
  • Dimensions and Weight: 360(W) × 440(D) × 580(H) mm

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Other company product

AIS2500C

  • Category: Electron Microscopy
  • Technique: Scanning Electron Microscopy
  • Manufacturer: Seron
  • Country: South Korea
  • Available: Active
Detailed