Specifications

  • Category: Electron Microscopy
  • Technique: Desctop EM
  • Manufacturer: Angstrom Advanced
  • Country: USA
  • Available: Active
All specifications

About

Short description

Desktop multi-purpose SEM. High performance in all SEM modes & particle counting. Easy operation in a multi-user environment.

Specifications

Desktop multi-purpose SEM. High performance in all SEM modes & particle counting. Easy operation in a multi-user environment.

  • Status: Active
  • Country: USA
  • Electron gun type : W Thermionic source
  • Standard detectors : High Sensitivity SE Detector
  • Optional detectors : EDS, BSE, etc.
  • Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others) : Particle counter (Blob Analysis), measurement tools, filters, AOI, tiling
  • Resolution : 5 nm @ 30 kV SE
  • Electron beam resolution : 5 nm
  • Beam current : 1 pA – 8 µA
  • Accelerating voltage : 0.6 – 20 kV (Max 30 kV)
  • Image parameters : Area (320×240), Inspection (640×480), Photo (1280×960 to 5120×3840, option up to 8192×6144)
  • Magnification : 10X – 150,000X (optional 200,000X), Digital Zoom ×2/×4/×8
  • Camera details : 22” LCD display
  • Stage parameters : 5-axis: X/Y/Z = 40 mm, Rotation = 360°; Tilt 0–90° optional; stage motorization optional
  • Vacuum system : Rotary + Turbo Pump; Full automation/manual mode; Pirani + Penning Gauge

Articles

Other company product

AA7000

  • Category: Electron Microscopy
  • Technique: Scanning Electron Microscopy
  • Manufacturer: Angstrom Advanced
  • Country: USA
  • Available: Active
Detailed