Specifications

  • Category: Electron Microscopy
  • Technique: Scanning Electron Microscopy
  • Manufacturer: Angstrom Advanced
  • Country: USA
  • Available: Active
All specifications

About

Short description

Multi-user SEM. High performance in all SEM modes & particle counter. Combines versatility and flexibility with ease of use.

Specifications

Multi-user SEM. High performance in all SEM modes & particle counter. Combines versatility and flexibility with ease of use.

  • Status: Active
  • Country: USA
  • Electron gun type : W Thermionic source
  • Standard detectors : High Sensitivity SE Detector
  • Optional detectors : EDX, WDX, etc.
  • Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others) : Particle counter (Blob Analysis), measurement tools, filters, AOI, tiling
  • Resolution : 3 nm @ 30 kV SE
  • Electron beam resolution : 3 nm
  • Beam current : 1 pA – 8 µA
  • Accelerating voltage : 0.6 – 30 kV
  • Image parameters : Area (640×480), Inspection (up to 2048×1536), Photo (2048×1536 to 8192×6144)
  • Magnification : 10X – 300,000X, Digital Zoom ×2/×4/×8
  • Chamber : Dia 810 × 190 (H) mm, ports for SE, BSE, EDS, CCD
  • Camera details : 22” LCD display
  • Stage parameters : 5-axis: X/Y/Z = 40 mm, Tilt: 0–60°, Rotation = 360°; motorization optional
  • Vacuum system : Rotary + Turbo Pump; Full automation/manual mode; Pirani + Penning Gauge
  • Environmental requirements : Air or gas (e.g., N₂) supply required for anti-vibration system
  • Vibration, Magnetic, Noise tolerance : Air-cylinder anti-vibrator included

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AA6000 mini

  • Category: Electron Microscopy
  • Technique: Desctop EM
  • Manufacturer: Angstrom Advanced
  • Country: USA
  • Available: Active
Detailed