Specifications

  • Category: Electron Microscopy
  • Technique: Scanning Electron Microscopy
  • Manufacturer: KYKY
  • Country: China
  • Available: Active
All specifications

About

Short description

Tungsten filament SEM with 3nm resolution at 30kV. Supports low vacuum and modular stage options. Interfaces for detectors and SEM+ tools.

Specifications

Tungsten filament SEM with 3nm resolution at 30kV. Supports low vacuum and modular stage options. Interfaces for detectors and SEM+ tools.

  • Status: Active
  • Country: China
  • Electron gun type : W Thermionic source
  • Standard detectors : Secondary Electron Detector; Semiconductor BSE Detecto; Infrared CCD
  • Optional detectors : Low-vacuum SED※; Low-vacuum BSED※
  • Cryo : Optional
  • STEM : Optional
  • Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others) : LaB6; EDS; EBSD; CL; WDS
  • Resolution : SE: 3nm@30kV, 8nm@3kV; BSE: 4nm@30kV
  • Electron beam resolution : SE: 3nm@30kV, 8nm@3kV
  • Accelerating voltage : 0.2kV–30kV
  • Magnification : 1x–450000x
  • Chamber : Optional Big size chamber; multiple interface at chamber
  • Camera details : Infrared CCD; Wide field navigation camera
  • Stage parameters : Five Axes Stage: X: 0–80mm, Y: 0–50mm, Z: 0–30mm, R: 360°, T: -5° to 70°
  • Sample size: Max Diameter: 175mm
  • Cooling system : Cooling Stage (modification option) ⇒ Optional
  • Vacuum system : Turbo Molecular pump + Mechanical pump

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Other company product

EM8200

  • Category: Electron Microscopy
  • Technique: Scanning Electron Microscopy
  • Manufacturer: KYKY
  • Country: China
  • Available: Active
Detailed