Specifications

  • Category: Electron Microscopy
  • Technique: Scanning Electron Microscopy
  • Manufacturer: Seron
  • Country: South Korea
  • Available: Active
All specifications

About

Short description

Premium normal SEM with LaB6. Optimized for resolving power and imaging large samples.

Specifications

Premium normal SEM with LaB6. Optimized for resolving power and imaging large samples.

  • Status: Active
  • Country: South Korea
  • Electron gun type : LaB₆ Thermionic source
  • Standard detectors : ET-Type SE Detector (SE-BSE mode)
  • Optional detectors : BSE, EDS, WDS, EBSD, TSEM, Load-lock Chamber
  • STEM : Optional
  • Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others) : Particle Counter, Blob Analysis, 3D-View, AOI, Histogram
  • Electron optics : 65° conical objective lens
  • Resolution : 2.0 nm @ 30kV SE, 3.0 nm BSE
  • Optical column : 65° conical objective lens
  • Accelerating voltage : 0.6 – 30kV (min. 0.2kV)
  • Image parameters : Up to 8192×6144
  • Magnification : 10× – 1,000,000×
  • Chamber : Optional large stage & chamber
  • Camera details : Optional CCD
  • Stage parameters : X/Y/Z: 60/70/65 mm; Tilt: -20° to 60° (max. 90°); Rotation: 360° Endless
  • Aberration Correction type : Yes (via conical lens design)
  • Vacuum system : Rotary + Turbo + Ion Pump; High and Low vacuum
  • Power Requirements and Consumption : 220–230V AC, 5KW, 50/60Hz
  • Environmental requirements : 22±2°C, Humidity < 70%
  • Vibration, Magnetic, Noise tolerance : 3μm/sec @ 5–10Hz; EMI compliant

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Other company product

AIS1800C

  • Category: Electron Microscopy
  • Technique: Scanning Electron Microscopy
  • Manufacturer: Seron
  • Country: South Korea
  • Available: Active
Detailed