Arctis

High-throughput, automated cryo-FIB-SEM designed for the cryo-electron tomography workflow

• Status: Active
• Country: USA
• Electron gun type : Schottky FEG
• Standard detectors : T1 (BSE), T2 (SE), ETD
• Cryo : Yes
• FIB: Yes
• Electron optics : UHR non-immersion field-emission SEM column
• Resolution : <2.6 nm at 2 kV
• Electron beam resolution : <2.6 nm at 2 kV
• Beam current : 1.5 pA to 400 nA
• Accelerating voltage : 0.2–30 kV
• Chamber : Compact chamber with cryo-box
• Camera details : Basler a2A4504-18umPRO with Sony IMX541 CMOS, 20.2 MP
• Stage parameters : CompuStage, ±90° tilt, 4-axis, eucentric point 10 mm
• Holder Types : TomoGrids, AutoGrids, FIB-AutoGrids
• Sample size: Up to 12 grid carriers
• Cooling system : Nitrogen cooling, automatic refill
• Vacuum system : Oil-free; <5×10⁻⁵ Pa
• Environmental requirements : Enclosed; 2.6 m height; optional heat decontamination
• Dimensions and Weight: 2.6 m enclosure height