Specifications

  • Category: Electron Microscopy
  • Technique: Scanning Electron Microscopy
  • Manufacturer: COXEM
  • Country: South Korea
  • Available: Active
All specifications

About

Short description

Provides a nanoparticle analysis solution including size, distribution, and composition. Designed for large-area sample analysis with tools like NaviCam and ChamberCam

Specifications

Provides a nanoparticle analysis solution including size, distribution, and composition. Designed for large-area sample analysis with tools like NaviCam and ChamberCam

  • Status: Active
  • Country: South Korea
  • Electron gun type : W Thermionic source
  • Standard detectors : SE, BSE
  • Optional detectors : EBSD, STEM, NaviCam, Coolstage
  • Cryo : Optional
  • STEM : Optional
  • Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others) : NanofiberScanner, EBSD, STEM
  • Electron optics : Motorized 5-axis stage, signal mixing, quad display, variable pressure mode, large-area optimized imaging
  • Resolution : <3 nm
  • Electron beam resolution : <3 nm
  • Accelerating voltage : 1–30 kV
  • Image parameters : Quad display & save, panorama, signal mixing, annotation, line profile, image filtering
  • Magnification : Photo: 6×–300,000×; Display: 9×–500,000×
  • Camera details : NaviCam, ChamberCam
  • Stage parameters : X: 100 mm, Y: 100 mm, Z: 60 mm, Rotation: 360°, Tilt: –20° to +90°
  • Holder Types : Multi-sample holder (-)
  • Cooling system : Optional (Coolstage)
  • Vacuum system : Turbo pump (80L) + Rotary pump (100L); HV, LV (20Pa), VP (10/20/30Pa)
  • Dimensions and Weight: 640(W) × 690(L) × 1,460(H) mm, 200 kg

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EM-30N

  • Category: Electron Microscopy
  • Technique: Desctop EM
  • Manufacturer: COXEM
  • Country: South Korea
  • Available: Active
Detailed