Specifications

  • Category: Electron Microscopy
  • Technique: Scanning Electron Microscopy
  • Manufacturer: Seron
  • Country: South Korea
  • Available: Active
All specifications

About

Short description

High-resolution FE-SEM. Fast scan speed, multitasking GUI, and strong image analysis features.

Specifications

High-resolution FE-SEM. Fast scan speed, multitasking GUI, and strong image analysis features.

  • Status: Active
  • Country: South Korea
  • Electron gun type : Schottky FEG
  • Standard detectors : ET-Type SE Detector (SE-BSE mode), CCD
  • Optional detectors : BSE, EDS, WDS, EBSD, TSEM, Load-lock Chamber
  • STEM : Optional
  • Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others) : Particle Counter, Blob Analysis, 3D-View, AOI, Histogram
  • Electron optics : Electromagnetic + Electrostatic, 60° conical objective lens
  • Resolution : 1.0 nm @ 30kV SE, 2.0 nm BSE
  • Optical column : 60° conical objective lens
  • Accelerating voltage : Up to 30kV (continuous)
  • Image parameters : Area Mode(640×480) to Photo Mode(8192×6144)
  • Magnification : 10× – 1,000,000×
  • Chamber : Optional large stage & chamber
  • Camera details : CCD included
  • Stage parameters : X/Y/Z: 50/70/65 mm; Tilt: ~60° (max. 90°); Rotation: 360° Endless
  • Aberration Correction type : Yes (via conical lens design)
  • Vacuum system : Rotary + Turbo + Ion Pump; High vacuum
  • Power Requirements and Consumption : 220–230V AC, 5KW, 50/60Hz
  • Environmental requirements : 22±2°C, Humidity < 70%
  • Vibration, Magnetic, Noise tolerance : 3μm/sec @ 5–10Hz; EMI compliant

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Other company product

SEMIRON 5000

  • Category: Electron Microscopy
  • Technique: Scanning Electron Microscopy
  • Manufacturer: Seron
  • Country: South Korea
  • Available: Active
Detailed