Specifications

  • Category: Electron Microscopy
  • Technique: Scanning Electron Microscopy
  • Manufacturer: KYKY
  • Country: China
  • Available: Active
All specifications

About

Short description

Schottky FEG SEM with 1.5nm SE resolution at 15kV. Includes five-axis stage and 175mm sample capacity. Supports multiple detectors and modular accessories.

Specifications

Schottky FEG SEM with 1.5nm SE resolution at 15kV. Includes five-axis stage and 175mm sample capacity. Supports multiple detectors and modular accessories.

  • Status: Active
  • Country: China
  • Electron gun type : Schottky FEG
  • Standard detectors : High Vacuum SE Detector; Infrared CCD; Four-quadrant BSE Detector; Optical navigation
  • Optional detectors : EDS; EBSD; STEM; CL; Heating Stage; Cooling Stage; Tensile Stage
  • Cryo : Optional
  • STEM : Optional
  • Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others) : EDS; EBSD; STEM; CL
  • Electron optics : Multi-stage high performance lens system
  • Resolution : SE 1.5nm@15kV, BSE 3nm@30kV
  • Electron beam resolution : SE 1.5nm@15kV
  • Accelerating voltage : 0.2kV–30kV
  • Magnification : 1x–600000x
  • Chamber : Customizable extra-large sample chamber
  • Camera details : Infrared CCD; Optical navigation ※
  • Stage parameters : Five axes: X:0–80mm, Y:0–50mm, Z:0–30mm, R:360°, T:-5° to 70°
  • Sample size: Max diameter: 175mm
  • Cooling system : Cooling Stage ⇒ Optional
  • Vacuum system : 2 Ion Pumps, 1 Magnetic Levitation Turbo Molecular Pump, 1 Dry Pump

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EM8010

  • Category: Electron Microscopy
  • Technique: Scanning Electron Microscopy
  • Manufacturer: KYKY
  • Country: China
  • Available: Active
Detailed