Specifications

  • Category: Electron Microscopy
  • Technique: Scanning Electron Microscopy
  • Manufacturer: EOI
  • Country: USA
  • Available: Active
All specifications

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Short description

Compact conventional SEM with high vacuum mode

Specifications

Compact conventional SEM with high vacuum mode

  • Status: Active
  • Country: USA
  • Electron gun type : W Thermionic source
  • Standard detectors : SE Detector (ET-type)
  • Optional detectors : EBSD, EDS, WDS, CL, Chamber Camera, LaB6 / CeB6 upgrade, 3D Imaging, Raman Spectroscopy, E-beam Lithography
  • Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others) : EBSD, EDS, WDS, CL, Raman Spectroscopy, E-beam Lithography
  • Resolution : 3.0 nm (SE Image)
  • Electron beam resolution : 3.0 nm
  • Accelerating voltage : 200 V – 30 kV
  • Image parameters : Dynamic Focus, Point & Line Scan, Tilt Compensation
  • Magnification : ×10 – ×300,000
  • Stage parameters : 5-axis Manual: X: 40 mm, Y: 40 mm, Z: 5–45 mm, Tilt: –20°~90°, Rotation: 360°
  • Sample size: Horizontal: 96 mm, Vertical: 50 mm
  • Vacuum system : High Vacuum only (<9×10⁻³ Pa)
  • Power Requirements and Consumption : 100–240 VAC, 50/60 Hz, 1 kVA
  • Dimensions and Weight: Main System: 600(W) × 623(D) × 1350(H) mm, 130 kg; Rotary Pump: 454(W) × 134(D) × 121(H) mm, 22 kg

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Veritas SEM

  • Category: Electron Microscopy
  • Technique: Scanning Electron Microscopy
  • Manufacturer: EOI
  • Country: USA
  • Available: Active
Detailed