Specifications

  • Category: Electron Microscopy
  • Technique: Scanning Electron Microscopy
  • Manufacturer: TESCAN
  • Country: Czechia
  • Available: Active
All specifications

About

Short description

Versatile SEM with advanced LaB₆ or tungsten optics. High and low vacuum imaging. Suitable for analytical, forensic, and biological work.

Specifications

Versatile SEM with advanced LaB₆ or tungsten optics. High and low vacuum imaging. Suitable for analytical, forensic, and biological work.

  • Status: Active
  • Country: Czechia
  • Electron gun type : W Thermionic source
  • Standard detectors : SE (Everhart-Thornley), YAG BSE detector
  • Optional detectors : EDX, EBSD, LVSTD, 3D, STEM
  • Cryo : Optional
  • STEM : Optional
  • STEM parameters: HAADF, BF/DF with retractable STEM
  • Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others) : EDX, EBSD, WDS, EasyEDX, 3D tomography, correlative microscopy
  • Electron optics : Wide Field Optics with Intermediate Lens, optimized for LaB₆ or tungsten emitter
  • Resolution : 3 nm at 30 keV (Tungsten), 2 nm at 30 keV (LaB₆)
  • Optical column : Intermediate Lens with beam shaping optics
  • Electron beam resolution : 2–3 nm depending on source
  • Beam current : 1 pA – 2 µA
  • Accelerating voltage : 200 eV – 30 keV
  • Image parameters : 16,384×16,384 pixels, In-Flight Beam Tracing, EasyEDX
  • Magnification : 3× – 1,000,000× (SB), 2× – 1,000,000× (LM)
  • Chamber : SB: 160 mm, LM: 230 mm, GM: 340×315 mm
  • Camera details : Optional IR camera, dual monitor support
  • Stage parameters : SB: 3-axis, LM: 5-axis, GM: 5-axis with 147 mm Z travel
  • Holder Types : Multi-sample stub holder, thin section holder, large sample holder
  • Sample size: Up to 300 mm diameter, 147 mm tall
  • Cooling system : Optional Peltier cooling stage
  • Vacuum system : High and low vacuum with UniVac up to 2000 Pa
  • Power Requirements and Consumption : 230 V, standard, with forevacuum pump
  • Environmental requirements : Standard lab environment, vibration isolation available
  • Vibration, Magnetic, Noise tolerance : Integrated vibration isolation (GM chamber)
  • Dimensions and Weight: Depends on chamber config (GM chamber largest)

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MAGNA

  • Category: Electron Microscopy
  • Technique: Scanning Electron Microscopy
  • Manufacturer: TESCAN
  • Country: Czechia
  • Available: Active
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