Specifications

  • Category: Electron Microscopy
  • Technique: Scanning Electron Microscopy
  • Manufacturer: JEOL
  • Country: Japan
  • Available: Active
All specifications

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Short description

High-resolution FE-SEM with in-lens Schottky Plus FEG. Integrated with Hybrid Lens, ACL, and advanced AI live image filtering. Supports SXES, EBSD, and large-area montage imaging.

Specifications

High-resolution FE-SEM with in-lens Schottky Plus FEG. Integrated with Hybrid Lens, ACL, and advanced AI live image filtering. Supports SXES, EBSD, and large-area montage imaging.

  • Status: Active
  • Country: Japan
  • Electron gun type : W Thermionic source
  • Standard detectors : SED, UED
  • Optional detectors : USD, BED, SXES, EBSD, TED, LVBED
  • Cryo : Optional
  • STEM : Optional
  • Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others) : SXES, EDS, EBSD, TED, WDS
  • Electron optics : Neo Engine, ACL, Hybrid Lens, BD, LDF
  • Resolution : 0.7 nm (20 kV), 1.3 nm (1 kV), 3.0 nm (15 kV, 5 nA, WD 10 mm); 1.3 nm (30 kV, 10 Pa) in low vacuum
  • Optical column : Hybrid Lens (electrostatic + magnetic)
  • Beam current : A few pA to 300 nA (30 kV)
  • Accelerating voltage : 0.01 to 30 kV
  • Image parameters : 640×480 to 5120×3840 px
  • Magnification : ×10 to ×2,000,000 (photo); ×27 to ×5,480,000 (display)
  • Chamber : Up to 200 mm diameter sample capacity
  • Camera details : Optional chamber camera
  • Stage parameters : Type1-3 options; up to X: 140 mm, Y: 80 mm, Tilt: -5°–70°
  • Holder Types : Up to 200 mm dia., 55 mm height
  • Sample size: Max Ø200 mm, H: 55 mm
  • Aberration Correction type : ACL (Aperture Control Lens) optimizes probe size
  • Cooling system : Cooling water required: 20 ±5°C
  • Vacuum system : SIP ×2, TMP, RP ×1
  • Power Requirements and Consumption : 100 V AC, 50/60 Hz, 3 kVA
  • Environmental requirements : 20 ±5°C, ≤60% RH, ≤0.3 μT
  • Vibration, Magnetic, Noise tolerance : ≤0.3 μT
  • Dimensions and Weight: 3,000 × 2,800 mm footprint (full system)

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Other company product

JEM-Z200MF

  • Category: Electron Microscopy
  • Technique: Transmission Electron Microscopy
  • Manufacturer: JEOL
  • Country: Japan
  • Available: Active
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