Specifications

  • Category: Electron Microscopy
  • Technique: Scanning Electron Microscopy
  • Manufacturer: Angstrom Advanced
  • Country: USA
  • Available: Active
All specifications

About

Short description

Multi-purpose SEM. Fully automated, high-performance, compact design. Fast scan speed, pixel resolution, and noise-free image acquisition.

Specifications

Multi-purpose SEM. Fully automated, high-performance, compact design. Fast scan speed, pixel resolution, and noise-free image acquisition.

  • Status: Active
  • Country: USA
  • Electron gun type : W Thermionic source
  • Standard detectors : Bar Type SE Detector (SE-BSE conversion mode without BSE detector)
  • Optional detectors : BSE, EDS, WDS, EBSD, CCD, manipulator
  • Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others) : EDS, WDS, EBSD, 3D data view, particle counter, Excel data export
  • Electron optics : Dual field objective lens for spherical aberration reduction; upgraded magnetic lens (CL/OL)
  • Resolution : 3.0 nm @ 30 kV SE / 4.0 nm @ BSE
  • Optical column : Electromagnetic condenser (2 stages), objective (1 stage), 8-pole stigmator
  • Electron beam resolution : 3.0 nm / 4.0 nm
  • Accelerating voltage : 0.5 – 30 kV
  • Image parameters : Search (640×480) >30 fps, Inspection (1280×960) 30 fps, Photo (4096×4096) 2 fps
  • Magnification : 10 – 1,000,000X
  • Chamber : 50 × 60 × 57 mm, supports multiple detectors
  • Stage parameters : X/Y/Z = 60/70/65 mm, Tilt: –20° to +60° (Max 90°), Rotation = 360°, Motorized X,Y,R (standard); full motorization optional
  • Aberration Correction type : Dual field objective lens, upgraded lens design for spherical aberration reduction
  • Vacuum system : Rotary Pump + Diffusion or Turbo Pump; Full automation with safety system

Articles

Other company product

AA8000

  • Category: Electron Microscopy
  • Technique: Scanning Electron Microscopy
  • Manufacturer: Angstrom Advanced
  • Country: USA
  • Available: Active
Detailed