Specifications

  • Category: Electron Microscopy
  • Technique: Scanning Electron Microscopy
  • Manufacturer: Seron
  • Country: South Korea
  • Available: Active
All specifications

About

Short description

Compact Normal SEM. Full automation and wide FOV. High compatibility with analysis tools.

Specifications

Compact Normal SEM. Full automation and wide FOV. High compatibility with analysis tools.

  • Status: Active
  • Country: South Korea
  • Electron gun type : W Thermionic source
  • Standard detectors : ET-Type SE Detector
  • Optional detectors : EDS, BSE, TSEM
  • STEM : Optional
  • Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others) : EDS, BSE, TSEM, 3D Reconstruction S/W
  • Electron optics : Electromagnetic Lens
  • Resolution : 3.0 nm @ 20/30kV SE
  • Accelerating voltage : 0.6–30kV
  • Image parameters : Up to 8192x6144
  • Magnification : 10X – 300,000X + Zoom 2X, 4X, 8X
  • Stage parameters : X/Y/Z 40mm; Tilt 0–60°; Rotation 360° Endless
  • Vacuum system : Rotary Pump + Turbo Pump
  • Power Requirements and Consumption : 220–230V AC, 5KW, 50/60Hz
  • Environmental requirements : 22±2°C, Humidity < 70%
  • Vibration, Magnetic, Noise tolerance : 3μm/sec @ 5–10Hz; EMI compliant
  • Dimensions and Weight: 388(W) × 600(D) × 638(H) mm

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LaB6

  • Category: Electron Microscopy
  • Technique: Scanning Electron Microscopy
  • Manufacturer: Seron
  • Country: South Korea
  • Available: Active
Detailed