Specifications

  • Category: Electron Microscopy
  • Technique: Scanning Electron Microscopy
  • Manufacturer: Thermo Fisher Scientific
  • Country: USA
  • Available: Active
All specifications

About

Short description

Dedicated cryo-FIB microscope to prepare cryo-lamellas for cryo-electron tomography

Specifications

Dedicated cryo-FIB microscope to prepare cryo-lamellas for cryo-electron tomography

  • Status: Active
  • Country: USA
  • Electron gun type : Schottky FEG
  • Standard detectors : T1, T2, ETD, ICE
  • Optional detectors : Optional acoustic enclosure, EasyLift, iFLM
  • Cryo : Yes
  • FIB: Yes
  • Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others) : EDS, cryo-lift-out, AutoScript
  • Electron optics : NICol UHR non-immersion field emission-SEM column
  • Resolution : 1.6 nm at 30 kV; 2.6 nm at 2 kV (RT); 6.0 nm at 2 kV (cryo)
  • Electron beam resolution : 1.6 nm at 30 kV; 2.6 nm at 2 kV (RT); 6.0 nm at 2 kV (cryo)
  • Beam current : 1.5 pA to 400 nA
  • Accelerating voltage : 200 V – 30 kV
  • Image parameters : 6144×4096 px; 25 ns to 25 ms/pixel
  • Camera details : IR camera; Nav-Cam
  • Stage parameters : 110×110 mm eucentric stage; Tilt: -15° to +55°
  • Holder Types : Cryo-FIB AutoGrids, Leica CLEM, pin mount stubs
  • Cooling system : LN2 Dewar, flow controller, exchanger
  • Vacuum system : Oil-free; <4e⁻⁴ Pa (RT), <8e⁻⁵ Pa (cryo)
  • Environmental requirements : Optional acoustic enclosure
  • Vibration, Magnetic, Noise tolerance : Seismic restraint kit

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Prisma E SEM

  • Category: Electron Microscopy
  • Technique: Scanning Electron Microscopy
  • Manufacturer: Thermo Fisher Scientific
  • Country: USA
  • Available: Active
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