Specifications

  • Category: Electron Microscopy
  • Technique: Scanning Electron Microscopy
  • Manufacturer: Seron
  • Country: South Korea
  • Available: Active
All specifications

About

Short description

High magnification SEM. Wide FOV and ultra pixel resolution. Designed for automation and large samples.

Specifications

High magnification SEM. Wide FOV and ultra pixel resolution. Designed for automation and large samples.

  • Status: Active
  • Country: South Korea
  • Electron gun type : W Thermionic source
  • Standard detectors : ET-Type SE Detector (SE-BSE mode)
  • Optional detectors : BSE, CCD, TSEM
  • STEM : Optional
  • Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others) : Particle Counter, Blob Analysis, 3D-View, AOI, Histogram
  • Electron optics : Electromagnetic Lens System
  • Resolution : 3.0 nm @ 30kV SE, 4.0 nm BSE
  • Accelerating voltage : 0.6 – 30kV (min. 0.2kV)
  • Image parameters : Area Mode(640×480), up to 8192×6144
  • Magnification : 10× – 1,000,000×
  • Chamber : Optional large stage & chamber
  • Camera details : Optional CCD
  • Stage parameters : X/Y/Z: 60/70/65 mm; Tilt: -20° to 60° (max. 90°); Rotation: 360° Endless
  • Vacuum system : Rotary + Turbo Pump; High vacuum; Low vacuum (optional)
  • Power Requirements and Consumption : 220–230V AC, 5KW, 50/60Hz
  • Environmental requirements : 22±2°C, Humidity < 70%
  • Vibration, Magnetic, Noise tolerance : 3μm/sec @ 5–10Hz; EMI compliant

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LaB6

  • Category: Electron Microscopy
  • Technique: Scanning Electron Microscopy
  • Manufacturer: Seron
  • Country: South Korea
  • Available: Active
Detailed