Specifications

  • Category: Electron Microscopy
  • Technique: Scanning Electron Microscopy
  • Manufacturer: CIQTEK 
  • Country: China
  • Available: Active
All specifications

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Short description

High-res FE-SEM with SuperTunnel optics, low aberration, magnetic-free imaging, and automated UI

Specifications

High-res FE-SEM with SuperTunnel optics, low aberration, magnetic-free imaging, and automated UI

  • Status: Active
  • Country: China
  • Electron gun type : Schottky FEG
  • Standard detectors : In-lens detector, ETD
  • Optional detectors : BSED (retractable), STEM, EDS, EBSD, Loadlock
  • STEM : Optional
  • STEM parameters: Retractable, large FOV STEM
  • Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others) : EDS, EBSD, WDS, 3D analysis
  • Electron optics : SuperTunnel optics, electromagnetic/electrostatic lens, no crossover design
  • Resolution : 0.8 nm @ 15 kV (SE), 1.2 nm @ 1 kV (SE)
  • Optical column : No crossover column; SuperTunnel path
  • Electron beam resolution : 0.8–1.2 nm depending on mode
  • Accelerating voltage : 0.02–30 kV
  • Image parameters : Auto image, navigation, brightness, stigmator
  • Magnification : 1× – 2,500,000×
  • Chamber : Loadlock optional; X/Y=110 mm, Z=50 mm
  • Camera details : Dual cameras
  • Stage parameters : 5-axis eucentric: X/Y=110 mm, Z=50 mm
  • Aberration Correction type : SuperTunnel reduces aberrations, no crossover
  • Cooling system : Water-cooled lens (for thermal control)
  • Vacuum system : Oil-free, auto; low-vacuum option
  • Vibration, Magnetic, Noise tolerance : Optional anti-vibration platform

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Other company product

HEM6000

  • Category: Electron Microscopy
  • Technique: Scanning Electron Microscopy
  • Manufacturer: CIQTEK 
  • Country: China
  • Available: Active
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