Specifications

  • Category: Electron Microscopy
  • Technique: Scanning Electron Microscopy
  • Manufacturer: Hitachi High-Tech
  • Country: Japan
  • Available: Active
All specifications

About

Short description

Tabletop microscope designed for quick imaging. Simple operation with high-sensitivity BSE/SE detectors. Suitable for non-conductive samples under low vacuum.

Specifications

Tabletop microscope designed for quick imaging. Simple operation with high-sensitivity BSE/SE detectors. Suitable for non-conductive samples under low vacuum.

  • Status: Active
  • Country: Japan
  • Electron gun type : W Thermionic source
  • Standard detectors : High-sensitivity 4-segment BSE detector
  • Optional detectors : SE detector (UVD), STEM holder, EDS
  • Cryo : Optional
  • STEM : Optional
  • STEM parameters: UVD detector used for STEM signal capture
  • Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others) : EDS (Bruker, EDAX, Oxford), 3D measurement, STEM, Report Creator
  • Electron optics : Compact SEM optics with low-vacuum functionality
  • Accelerating voltage : 5, 10, 15, 20 kV
  • Image parameters : SE, BSE, MIX, Shadow, TOPO, 3D mode
  • Magnification : 10×–100,000× (photo), 25×–250,000× (monitor)
  • Chamber : 80 mm diameter, 50 mm thickness
  • Camera details : 2,560×1,920, 1,280×960, 640×480; BMP, TIFF, JPEG
  • Stage parameters : X: 40 mm, Y: 35 mm; optional tilt & rotation stage: 15°–60° tilt, 360° rotation
  • Holder Types : STEM holder, cooling stage, tilt & rotation stage
  • Sample size: Max diameter 80 mm, thickness 50 mm
  • Cooling system : Optional cooling stage (down to –25 °C)
  • Vacuum system : Turbo molecular and diaphragm pump
  • Power Requirements and Consumption : Single-phase AC100–240 V, 500 VA
  • Environmental requirements : 15–30 °C, ≤70% RH
  • Dimensions and Weight: 330×617×547 mm, 54 kg

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  • Technique: Spark-OES/GD-OES
  • Manufacturer: Hitachi High-Tech
  • Country: Japan
  • Available: Active
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