Specifications

  • Category: Electron Microscopy
  • Technique: Scanning Electron Microscopy
  • Manufacturer: Seron
  • Country: South Korea
  • Available: Active
All specifications

About

Short description

High-performance SEM with LaB6. 65° conical lens for high-resolution wide specimen imaging.

Specifications

High-performance SEM with LaB6. 65° conical lens for high-resolution wide specimen imaging.

  • Status: Active
  • Country: South Korea
  • Electron gun type : LaB₆ Thermionic source
  • Standard detectors : ET-Type SE Detector (SE-BSE mode)
  • Optional detectors : BSE, EDS, WDS, EBSD, TSEM, Load-lock Chamber
  • STEM : Optional
  • Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others) : Particle Counter, Blob Analysis, 3D-View, AOI, Histogram
  • Electron optics : Electromagnetic 2-stage condenser + 65° conical objective lens
  • Resolution : 2.0 nm @ 30kV SE, 3.0 nm BSE
  • Optical column : 65° conical objective lens
  • Accelerating voltage : 0.6 – 30kV (min. 0.2kV)
  • Image parameters : Up to 8192×6144
  • Magnification : 10× – 1,000,000×
  • Chamber : Optional large stage & chamber
  • Camera details : Optional CCD
  • Stage parameters : X/Y/Z: 60/70/65 mm; Tilt: -20° to 60° (max. 90°); Rotation: 360° Endless
  • Aberration Correction type : Yes (via conical lens design)
  • Vacuum system : Rotary + Turbo + Ion Pump; High and Low vacuum
  • Power Requirements and Consumption : 220–230V AC, 5KW, 50/60Hz
  • Environmental requirements : 22±2°C, Humidity < 70%
  • Vibration, Magnetic, Noise tolerance : 3μm/sec @ 5–10Hz; EMI compliant

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LaB6

  • Category: Electron Microscopy
  • Technique: Scanning Electron Microscopy
  • Manufacturer: Seron
  • Country: South Korea
  • Available: Active
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