Specifications

  • Category: Electron Microscopy
  • Technique: Scanning Electron Microscopy
  • Manufacturer: Thermo Fisher Scientific
  • Country: USA
  • Available: Active
All specifications

About

Short description

DualBeam with switchable PFIB species (Xe, Ar, O, N); Ga-free sample prep and 3D characterization; High-throughput, multi-modal system

Specifications

DualBeam with switchable PFIB species (Xe, Ar, O, N); Ga-free sample prep and 3D characterization; High-throughput, multi-modal system

  • Status: Active
  • Country: USA
  • Electron gun type : Schottky FEG
  • Standard detectors : TLD-SE/BSE, ICD, ETD, ICE, IR, Nav-Cam, DBS
  • Optional detectors : STEM 3+, EDS, EBSD, WDS
  • Cryo : Yes
  • FIB: Yes
  • STEM : Yes
  • STEM parameters: BF, DF, HAADF segments
  • Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others) : EDS, EBSD, WDS, AutoTEM 5, AS&V4
  • Electron optics : Elstar SEM Column, magnetic immersion lens, UC+ monochromator
  • Resolution : 0.6 nm at 15 kV; 1.2 nm at 1 kV; 0.7 nm at 1 kV; 1.0 nm at 500 V
  • Optical column : Elstar SEM Column with SmartAlign, ConstantPower lens
  • Beam current : Electron: 0.8 pA – 100 nA; Ion: 1.5 pA – 2.5 µA
  • Accelerating voltage : SEM: 350 V–30 kV; FIB: 500 V–30 kV
  • Image parameters : 25 ns – 25 ms/pixel; up to 6144×4096 px; DCFI, SmartScan
  • Chamber : 21 ports; 379 mm width; Integrated plasma cleaner
  • Camera details : IR camera; In-chamber Nav-Cam Camera
  • Stage parameters : 5-axis motorized with piezo XYR; XY: 150 mm; Tilt: -38°/+60°
  • Holder Types : Multi-purpose, vise, UMB, wafer/custom
  • Sample size: Up to 150 mm with full rotation
  • Cooling system : CryoMAT; 4-day cold trap
  • Vacuum system : Oil-free; <2.6×10⁻⁶ mbar; evac <5 min
  • Environmental requirements : Acoustic enclosure reduces sensitivity
  • Vibration, Magnetic, Noise tolerance : DCFI; SmartAlign; integrated cleaning

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