Specifications

  • Category: Electron Microscopy
  • Technique: Scanning Electron Microscopy
  • Manufacturer: CIQTEK 
  • Country: China
  • Available: Active
All specifications

About

Short description

Advanced tungsten SEM with high vacuum performance, wide FOV, and up to 1,000,000× magnification

Specifications

Advanced tungsten SEM with high vacuum performance, wide FOV, and up to 1,000,000× magnification

  • Status: Active
  • Country: China
  • Electron gun type : W Thermionic source
  • Standard detectors : ET detector, BSE detector
  • Optional detectors : STEM, EDS, EBSD
  • Cryo : Optional
  • STEM : Optional
  • Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others) : EDS, EBSD, STEM
  • Electron optics : Magnetic/electrostatic lens with large chamber and stage options
  • Resolution : 2.0 nm @ 30 kV (SE), 3.0 nm @ 3 kV (SE), 3.0 nm @ 30 kV (BSE), 5.0 nm @ 3 kV (BSE)
  • Electron beam resolution : 2.0–5.0 nm depending on voltage and detector
  • Accelerating voltage : 200 V – 30 kV
  • Image parameters : Auto image, drift correction, real-time filtering
  • Magnification : 10× – 1,000,000×
  • Chamber : Large chamber with up to 16 accessory ports
  • Camera details : Dual camera (navigation and chamber view)
  • Stage parameters : 5-axis: X/Y = 110 mm, Z = 50 mm, Tilt = –10° to +90°, Rotation = 360°
  • Holder Types : Multi-specimen stub holder
  • Vacuum system : High and low vacuum modes

Articles

Other company product

SEM3200

  • Category: Electron Microscopy
  • Technique: Scanning Electron Microscopy
  • Manufacturer: CIQTEK 
  • Country: China
  • Available: Active
Detailed