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Genesis-2020
Main
Inst. Database
Scanning Electron Microscopy
Specifications
Category:
Electron Microscopy
Technique:
Scanning Electron Microscopy
Manufacturer:
EOI
Country:
USA
Available:
Active
All specifications
Download “Conclusions.PDF”
Download “Conclusions.PDF”
About
Specifications
About
Short description
Medium-sized SEM with motorized stage, high vacuum mode
All about
Specifications
Medium-sized SEM with motorized stage, high vacuum mode
Status:
Active
Country:
USA
Electron gun type
:
W Thermionic source
Standard detectors
:
SE Detector (ET-type)
Optional detectors
:
EBSD, EDS, WDS, CL, Chamber Camera, LaB6 / CeB6 upgrade, 3D Imaging, Raman Spectroscopy, E-beam Lithography
Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others)
:
EBSD, EDS, WDS, CL, Raman Spectroscopy, E-beam Lithography
Resolution
:
3.0 nm (SE Image)
Electron beam resolution
:
3.0 nm
Accelerating voltage
:
200 V – 30 kV
Image parameters
:
Dynamic Focus, Point & Line Scan, Tilt Compensation
Magnification
:
×10 – ×300,000
Stage parameters
:
5-axis Motorized: X: 90 mm, Y: 60 mm, Z: 5–60 mm, Tilt: –20°~90°, Rotation: 360°
Sample size:
Horizontal: 150 mm, Vertical: 60 mm
Vacuum system
:
High Vacuum only (<9×10⁻³ Pa)
Power Requirements and Consumption
:
100–240 VAC, 50/60 Hz, 1 kVA
Dimensions and Weight:
Main System: 600(W) × 623(D) × 1350(H) mm, 130 kg; Rotary Pump: 454(W) × 134(D) × 121(H) mm, 22 kg
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