SEM2100

Entry-level tungsten SEM designed for routine inspections and educational use

• Status: Active
• Country: China
• Electron gun type : W Thermionic source
• Standard detectors : ET detector, BSE detector
• Optional detectors : STEM, EDS
• Cryo : Optional
• STEM : Optional
• Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others) : EDS, STEM
• Electron optics : Electrostatic optics with compact design
• Resolution : 4.0 nm @ 30 kV (SE), 5.0 nm @ 3 kV (SE), 5.0 nm @ 30 kV (BSE), 6.0 nm @ 3 kV (BSE)
• Electron beam resolution : 4.0–6.0 nm depending on voltage and detector
• Accelerating voltage : 200 V – 30 kV
• Image parameters : Real-time imaging, auto focus, contrast enhancement
• Magnification : 10× – 300,000×
• Chamber : Compact chamber
• Camera details : Navigation camera (optional)
• Stage parameters : 3-axis: Z, Tilt, Rotation
• Holder Types : Multi-specimen stub holder
• Vacuum system : High vacuum only