Specifications

  • Category: Electron Microscopy
  • Technique: Desctop EM
  • Manufacturer: COXEM
  • Country: South Korea
  • Available: Active
All specifications

About

Short description

High-performance compact SEM with SE and BSE imaging. Designed for education, quality control, and research with high-resolution capability

Specifications

High-performance compact SEM with SE and BSE imaging. Designed for education, quality control, and research with high-resolution capability

  • Status: Active
  • Country: South Korea
  • Electron gun type : W Thermionic source
  • Standard detectors : SE, BSE
  • Optional detectors : BSE, EDS, EBSD, STEM, Cool stage
  • Cryo : Optional
  • STEM : Optional
  • Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others) : EDS, EBSD, STEM
  • Electron optics : Manual Z stage, electrostatic optics with signal mixing and dual detectors
  • Resolution : < 5 nm
  • Electron beam resolution : < 5 nm
  • Accelerating voltage : 1 – 30 kV
  • Image parameters : Signal mixing, image enhancement, histogram equalization, measurement, annotation tools
  • Magnification : ×20 to ×150,000 (Digital zoom ×1 ~ ×12)
  • Stage parameters : Z-axis manual; 3-axis holder adjustment
  • Holder Types : Multi-pin stub holder
  • Cooling system : Optional (Cool stage)
  • Vacuum system : Turbo pump (80L) + Rotary pump (100L); High, Low, Variable pressure modes
  • Dimensions and Weight: 306 × 582 × 566 mm, 75 kg

Articles

Other company product

CX-200K

  • Category: Electron Microscopy
  • Technique: Scanning Electron Microscopy
  • Manufacturer: COXEM
  • Country: South Korea
  • Available: Active
Detailed