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Cube II
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Inst. Database
Desctop EM
Specifications
Category:
Electron Microscopy
Technique:
Desctop EM
Manufacturer:
EOI
Country:
USA
Available:
Active
All specifications
Download “Conclusions.PDF”
Download “Conclusions.PDF”
About
Specifications
About
Short description
Tabletop SEM with intuitive UI, fast vacuum cycle, and charge reduction imaging
All about
Specifications
Tabletop SEM with intuitive UI, fast vacuum cycle, and charge reduction imaging
Status:
Active
Country:
USA
Electron gun type
:
W Thermionic source
Standard detectors
:
SE Detector, 4CH BSE Detector
Optional detectors
:
EDS, Auto Rotation, Auto Tilt, Chamber Camera, Navigation
STEM
:
Optional
Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others)
:
SEM-EDS integration, Auto Rotation, Auto Tilt
Electron optics
:
Electromagnetic/electrostatic optics with SE and BSE; beam shift 100 μm
Resolution
:
5.0 nm (SE image at 30 kV)
Electron beam resolution
:
5.0 nm
Accelerating voltage
:
1 – 30 kV
Image parameters
:
Focus, preview, slow, and photo modes; 3200×2400 max; auto brightness/focus/filament
Magnification
:
×10 – ×200,000
Camera details
:
Navigation camera; optional chamber camera
Stage parameters
:
5-axis: X/Y: 42 mm (motorized), Z: 5–53 mm, Tilt: ±90° (manual), Rotation: 360°
Sample size:
Horizontal: 140 mm, Vertical: 80 mm
Vacuum system
:
Turbo pump + rotary vane pump, auto valve system; vacuum ready in 90 sec
Power Requirements and Consumption
:
100 – 240 VAC, 50/60 Hz, 1 kVA
Environmental requirements
:
15 – 25 °C, 20–80% RH
Dimensions and Weight:
410 × 440 × 520 mm, 65 kg
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