Specifications

  • Category: Electron Microscopy
  • Technique: Desctop EM
  • Manufacturer: EOI
  • Country: USA
  • Available: Active
All specifications

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Short description

Tabletop SEM with intuitive UI, fast vacuum cycle, and charge reduction imaging

Specifications

Tabletop SEM with intuitive UI, fast vacuum cycle, and charge reduction imaging

  • Status: Active
  • Country: USA
  • Electron gun type : W Thermionic source
  • Standard detectors : SE Detector, 4CH BSE Detector
  • Optional detectors : EDS, Auto Rotation, Auto Tilt, Chamber Camera, Navigation
  • STEM : Optional
  • Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others) : SEM-EDS integration, Auto Rotation, Auto Tilt
  • Electron optics : Electromagnetic/electrostatic optics with SE and BSE; beam shift 100 μm
  • Resolution : 5.0 nm (SE image at 30 kV)
  • Electron beam resolution : 5.0 nm
  • Accelerating voltage : 1 – 30 kV
  • Image parameters : Focus, preview, slow, and photo modes; 3200×2400 max; auto brightness/focus/filament
  • Magnification : ×10 – ×200,000
  • Camera details : Navigation camera; optional chamber camera
  • Stage parameters : 5-axis: X/Y: 42 mm (motorized), Z: 5–53 mm, Tilt: ±90° (manual), Rotation: 360°
  • Sample size: Horizontal: 140 mm, Vertical: 80 mm
  • Vacuum system : Turbo pump + rotary vane pump, auto valve system; vacuum ready in 90 sec
  • Power Requirements and Consumption : 100 – 240 VAC, 50/60 Hz, 1 kVA
  • Environmental requirements : 15 – 25 °C, 20–80% RH
  • Dimensions and Weight: 410 × 440 × 520 mm, 65 kg

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  • Category: Electron Microscopy
  • Technique: Scanning Electron Microscopy
  • Manufacturer: EOI
  • Country: USA
  • Available: Active
Detailed