Specifications

  • Category: Electron Microscopy
  • Technique: Desctop EM
  • Manufacturer: JEOL
  • Country: Japan
  • Available: Active
All specifications

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Short description

TEM with high-sensitivity sCMOS camera, Limitless Panorama imaging, and wide application support including STEM, EDS, and tomography

Specifications

TEM with high-sensitivity sCMOS camera, Limitless Panorama imaging, and wide application support including STEM, EDS, and tomography

  • Status: Active
  • Country: Japan
  • Standard detectors : JEOL sCMOS camera (Matataki Flash)
  • Optional detectors : STEM/EDS, Tomography, optional diffraction components
  • Cryo : Optional
  • STEM : Optional
  • STEM parameters: STEM-BF, STEM-DF, Image Acquisition Unit, SCOD and Image Acquisition Device required
  • Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others) : STEM, EDS, Tomography, Picture Overlay, Asbestos analysis
  • Electron optics : Standard TEM column with optional STEM and tomography support
  • Resolution : 0.2 nm (HC), 0.14 nm (HR)
  • Electron beam resolution : STEM BF image (edge to edge): 2.0 nm (HC), 1.5 nm (HR)
  • Accelerating voltage : 10 to 120 kV
  • Image parameters : Auto montage, auto exposure, auto focus, LLP, Picture Overlay, Cryo, STEM/EDS, tomography
  • Magnification : TEM: ×200 to ×1,200,000, STEM: ×5,000 to ×2,000,000 (STD), ×10,000 to ×2,000,000 (HR)
  • Camera details : Matataki Flash sCMOS: 2048×2048, 30 fps, 16-bit TIFF/BMP/JPEG
  • Stage parameters : Tilt-X ±70° (High Tilting), ±25° (Standard), Tilt-Y ±9°
  • Holder Types : Quick Change Holder, Quartet, High Tilting, Beryllium Retainer, Specimen Tilting, Cryo-compatible holders
  • Cooling system : Flow rate 3–5 L/min, 1,600–2,500 W, 0.2–0.3 MPa
  • Vacuum system : TMP or DP vacuum pump, cryo support optional
  • Power Requirements and Consumption : Single phase 200 V, 5 kVA (main), 8 kVA (with STEM), compressor: 1.0 kVA
  • Environmental requirements : 15–25 ℃, fluctuation ≤1 ℃/h, humidity ≤60%, vibration ≤6.3 μm/s, magnetic variation ≤0.1 μT, noise ≤60 dB
  • Vibration, Magnetic, Noise tolerance : Vibration ≤6.3 μm/s, magnetic field variation ≤0.1 μT, noise ≤60 dB
  • Dimensions and Weight: Floor: 2,700×3,000 mm, height ≥2,600 mm, entrance ≥800×1,800 mm

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  • Category: Electron Microscopy
  • Technique: Transmission Electron Microscopy
  • Manufacturer: JEOL
  • Country: Japan
  • Available: Active
Detailed