Specifications

  • Category: Electron Microscopy
  • Technique: Desctop EM
  • Manufacturer: JEOL
  • Country: Japan
  • Available: Active
All specifications

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Short description

Compact, easy-to-use TEM with NeoView camera and ECO mode; suited for biological applications and routine use

Specifications

Compact, easy-to-use TEM with NeoView camera and ECO mode; suited for biological applications and routine use

  • Status: Active
  • Country: Japan
  • Electron gun type : W Thermionic source
  • Standard detectors : Multi-functional digital camera NeoView
  • Optional detectors : JEOL SightSKY CMOS, LLP, CLEM, tomography
  • Cryo : Optional
  • STEM : Optional
  • STEM parameters: Optional SCAN/STEM functions, single-crystal LaB6 recommended
  • Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others) : LLP, CLEM, Tomography (SIF), EDS (optional)
  • Electron optics : Fully automated apertures, no magnification switching required
  • Resolution : 0.2 nm (HC), 0.14 nm (HR)
  • Accelerating voltage : 20 to 120 kV
  • Image parameters : NeoView camera, high frame rate, drift correction, LLP, CLEM
  • Magnification : ×50 to ×1,200,000 (HC), ×50 to ×1,500,000 (HR)
  • Camera details : NeoView camera: 4M pixels, 30 fps, TIFF/BMP/JPEG
  • Stage parameters : X/Y shift ±1 mm, Z ±0.3 mm, tilt-X ±35° (Quick), ±80° (High Tilting), tilt-Y ±18°/±30°
  • Holder Types : Quick Change Holder, Specimen Quartet, High Tilting, Common Holder, Beryllium Retainer
  • Cooling system : Flow rate 6 L/min, 1,600 W heat, 0.1–0.14 MPa
  • Vacuum system : Full dry evacuation system
  • Power Requirements and Consumption : Single phase 200 V, 5 kVA
  • Environmental requirements : 15–25 ℃, fluctuation ≤1 ℃/h, humidity ≤60%
  • Dimensions and Weight: Floor: 3,000×3,300 mm, height ≥2,200 mm, entrance ≥900×1,900 mm

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  • Category: Electron Microscopy
  • Technique: Desctop EM
  • Manufacturer: JEOL
  • Country: Japan
  • Available: Active
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