Specifications

  • Category: Electron Microscopy
  • Technique: Desctop EM
  • Manufacturer: JEOL
  • Country: Japan
  • Available: Active
All specifications

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Short description

Benchtop SEM with Live Analysis, Zeromag optical-SEM integration, 3D imaging, compact and user-friendly

Specifications

Benchtop SEM with Live Analysis, Zeromag optical-SEM integration, 3D imaging, compact and user-friendly

  • Status: Active
  • Country: Japan
  • Electron gun type : W Thermionic source
  • Standard detectors : Secondary and backscattered electron detectors (composition, topographic, shadow, 3D images)
  • Optional detectors : EDS, Particle Analysis Software 3, 3D Analysis Software, Stage Navigation, Tilting/Rotating holder
  • Cryo : Optional
  • Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others) : Live EDS, Live Map, Particle Analysis, 3D analysis, Asbestos check, elemental maps
  • Electron optics : High and low vacuum modes, motor drive stage, optional stage navigation system
  • Accelerating voltage : 5, 10, 15 kV (3 steps)
  • Image parameters : SE and BE images, Live 3D, elemental map, backscattered topographic and compositional images
  • Magnification : ×10 to ×100,000; Display: ×24 to ×202,168
  • Chamber : Draw-out specimen chamber; 80 mm dia. × 50 mm height
  • Camera details : 640×480 to 5120×3840; 24” LCD monitor
  • Stage parameters : X-Y motor drive stage, X: 40 mm, Y: 40 mm
  • Holder Types : Tilting and rotating motor drive holder (optional)
  • Sample size: Max 80 mm dia. × 50 mm height
  • Cooling system : No cooling water or LN2 required
  • Vacuum system : Fully automatic, TMP + RP
  • Power Requirements and Consumption : 100/120/220/240 V AC, max 960 VA
  • Environmental requirements : Humidity 30–60% RH, desk ≥100 kg, rigid
  • Dimensions and Weight: 324×586×566 mm, 67 kg

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JSM-IT810

  • Category: Electron Microscopy
  • Technique: Scanning Electron Microscopy
  • Manufacturer: JEOL
  • Country: Japan
  • Available: Active
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