CRYO ARM 300 II (JEM-3300)

Field emission cryo-electron microscope for single particle analysis, tomography, and MicroED. Includes new CFEG and Omega filter with improved stability. Enables automated screening, data acquisition, and long-term sample storage.

• Status: Active
• Country: Japan
• Electron gun type : Cold FEG
• Optional detectors : BF-STEM, DF-STEM, Hole-free phase plate
• Cryo : Yes
• STEM : Optional
• STEM parameters: BF-STEM, DF-STEM detectors
• Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others) : Energy-filtered imaging, EELS, TEMography, MicroED, JADAS automation
• Electron optics : Cold FEG with <0.35 eV energy spread; in-column Omega filter
• Resolution : <0.35 eV energy spread; application resolution: 1.98 Å (GroEL), 2.5 Å (Photosystem I), 2.1 Å (Catalase diffraction)
• Optical column : In-column Omega energy filter
• Beam current : Stabilized probe current for 8 hrs; fluctuation <10%
• Accelerating voltage : Standard: 300 kV, 200 kV; optional: low accelerating voltage (-)
• Chamber : Air-lock cryo-transfer system; specimen exchange and storage built-in
• Camera details : Direct detection camera
• Stage parameters : Motor drive X/Y (±1 mm), Z (±0.2 mm); Tilt-X ±70°; Rotation 0° or 90°
• Holder Types : Specimen cartridge for 4; parking stage for 12
• Cooling system : Liquid nitrogen, automated filling system
• Power Requirements and Consumption : 3-phase, 200 V AC, 12 kVA
• Environmental requirements : Temp: 15–25°C (±1°C/h); RH ≤60%; pressure fluctuation ≤30 Pa; noise ≤60 dB
• Dimensions and Weight: Microscope Room: 6000×5500 mm; Ceiling: 3850 mm