JEM-2100Plus

Multi-purpose TEM, successor of JEM-2100, advanced control system, TEM Center UI, STEM integration

• Status: Active
• Country: Japan
• Standard detectors : JEOL bottom-mount camera (Ruby 8MP CCD or Matataki Flash sCMOS)
• STEM : Yes
• STEM parameters: STEM-BF, STEM-DF, auto contrast, scan rotation
• Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others) : EDS with STEM, STEM tomography, SightX Viewer software
• Electron optics : JEM-2100 optical system with advanced control and integration
• Resolution : Lattice: 0.14 nm; Point-to-point: 0.194–0.31 nm; STEM BF: 1.0 nm
• Electron beam resolution : STEM BF image (edge to edge): 1.0 nm
• Accelerating voltage : 80, 100, 120, 160, 200 kV
• Image parameters : BF/DF TEM, STEM-BF/DF, Ronchigram, montage, drift correction
• Magnification : TEM: ×30 to ×8,000,000; STEM: ×100 to ×2,000,000
• Camera details : JEOL Ruby 8MP CCD or Matataki Flash sCMOS
• Stage parameters : Stage navigation, drift correction, fully integrated movement
• Cooling system : Flow rate 7.5 L/min, temperature 15–20 °C, pressure 0.2–0.3 MPa
• Power Requirements and Consumption : 200 V AC, 10 kVA
• Environmental requirements : Temperature 20 ±5 °C, fluctuation ≤1 °C/h, humidity ≤60%
• Dimensions and Weight: Floor space 2,800×3,000 mm, ceiling height ≥2,800 mm, entrance ≥800×1,900 mm